JEDEC JESD91-A (R2011)
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The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.
Product Details
- Published:
- 08/01/2003
- Number of Pages:
- 20
- File Size:
- 1 file , 110 KB