JEDEC JESD340 (R2009)

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This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.

Product Details

Published:

11/01/1967

Number of Pages:

13

File Size:

1 file , 410 KB