IEC 63202-1 Ed. 1.0 b:2019

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IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.

Product Details

Edition:

1.0

Published:

06/20/2019

Number of Pages:

17

File Size:

1 file , 1.1 MB