IEC 62527 Ed. 1.0 en:2007

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STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Product Details

Edition:

1.0

Published:

11/07/2007

Number of Pages:

39

File Size:

1 file , 1 MB