IEC 62132-4 Ed. 1.0 b:2006

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Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

Product Details

Edition:

1.0

Published:

02/21/2006

Number of Pages:

49

File Size:

1 file , 700 KB