IEEE P2818

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New IEEE Standard – Active – Draft.This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.

Product Details

ISBN(s):

9781504495158

Number of Pages:

36

File Size:

1 file , 730 KB

Product Code(s):

STDUD26013

Note:

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