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BS QC 790107:1995

Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
standard by BSI Group, 05/15/1995

BS QC 300203:1985

Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E
standard by BSI Group, 04/15/1985

BS PD ISO/TS 21569-4:2016

Horizontal methods for molecular biomarker analysis. Methods of analysis for the detection of genetically modified organisms and derived products. Real-time PCR based screening methods for the detection of the $iP$i-$in$io$is and $iP$i-$in$io$is$i-$in$ip$it$iI$iI DNA sequences
standard by BSI Group, 11/30/2016

BS QC 750114:1996

Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
standard by BSI Group, 12/15/1996

BS TA 46:1973

Specification for bar and section for machining of titanium-aluminium-molybdenum-tin-silicon alloy (tensile strength 1050-1220 N/mm^2) (limiting ruling section over 25 mm up to and including 100 mm)
standard by BSI Group, 02/02/1973

BS S 201:1967

Specification for patented cold drawn carbon steel wire and springs (high duty unground wire)
standard by BSI Group, 08/24/1967