Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E
standard by BSI Group, 04/15/1985
Horizontal methods for molecular biomarker analysis. Methods of analysis for the detection of genetically modified organisms and derived products. Real-time PCR based screening methods for the detection of the $iP$i-$in$io$is and $iP$i-$in$io$is$i-$in$ip$it$iI$iI DNA sequences
standard by BSI Group, 11/30/2016
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
standard by BSI Group, 12/15/1996
Specification for bar and section for machining of titanium-aluminium-molybdenum-tin-silicon alloy (tensile strength 1050-1220 N/mm^2) (limiting ruling section over 25 mm up to and including 100 mm)
standard by BSI Group, 02/02/1973
Specifications for hydraulic surface-check type lubricating nipples for aircraft
standard by BSI Group, 03/29/1956
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
standard by BSI Group, 05/15/1995
Washers for unified hexagons for aircraft (primarily for facing purposes )
standard by BSI Group, 03/31/1959
Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure
standard by BSI Group, 07/15/1992
