Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories
standard by BSI Group, 05/15/1995
Varistors for use in electronic equipment. Blank detail specification for silicon carbide surge suppression varistors. Assessment level E
standard by BSI Group, 09/15/1992
Specification for 18/10 chromium-nickel corrosion-resisting steel tube (titanium stabilized: 550 N/mm^2) (weldable)
standard by BSI Group, 10/27/1972
Specification for 24/17 chromium-nickel heat-resisting steel sheet and strip (titanium stabilized: 540 MPa) (elevated temperature properties not verified)
standard by BSI Group, 01/27/1970
Specification for 12 per cent chromium corrosion-resisting steel (60/80 kgf/mm^2 (38/51 tonf/in^2): limiting ruling section 150 mm (6in))
standard by BSI Group, 04/17/1968
Specification for forging stock of titanium-copper alloy (tensile strength 650-880 N/mm^2) (limiting ruling section 75 mm)
standard by BSI Group, 04/30/1973
Base Process Library (BPL) Version 1.1.2, TickITplus
Handbook / Manual / Guide by BSI Group, 04/05/2012
Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for single-turn rotary low-power wirewound and non-wirewound potentiometers
standard by BSI Group, 07/15/1992
Specifications for turnbarrels, tension rods and swaged cable-end connections for aircraft
standard by BSI Group, 11/19/1951
Harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Sectional specification for rotary precision potentiometers
standard by BSI Group, 07/15/1992