IEC 62052-31 Ed. 1.0 en:2015
Electricity metering equipment (AC) – General requirements, tests and test conditions – Part 31: Product safety requirements and tests
standard by International Electrotechnical Commission, 09/15/2015
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IEC 62056-7-3 Ed. 1.0 en:2017
Electricity metering data exchange – The DLMS/COSEM suite – Part 7-3: Wired and wireless M-Bus communication profiles for local and neighbourhood networks
standard by International Electrotechnical Commission, 03/07/2017
IEC 61800-7-304 Ed. 2.0 b:2015
Adjustable speed electrical power drive systems – Part 7-304: Generic interface and use of profiles for power drive systems – Mapping of profile type 4 to network technologies
standard by International Electrotechnical Commission, 11/20/2015
IEC 62007-2 Ed. 2.0 b:2009
Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods
standard by International Electrotechnical Commission, 01/26/2009
IEC 61784-3-2 Ed. 3.0 b:2016
Industrial communication networks – Profiles – Part 3-2: Functional safety fieldbuses – Additional specifications for CPF 2
standard by International Electrotechnical Commission, 07/13/2016
IEC 62127-1 Amd.1 Ed. 1.0 b:2013
Amendment 1 – Ultrasonics – Hydrophones – Part 1: Measurement and characterization of medical ultrasonic fields up to 40 MHz
Amendment by International Electrotechnical Commission, 02/08/2013
IEC 61967-2 Ed. 1.0 b:2005
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 2: Measurement of radiated emissions – TEM cell and wideband TEM cell method
standard by International Electrotechnical Commission, 09/29/2005
IEC 61858 Ed. 3.0 b:2008
Electrical insulation systems – Thermal evaluation of modifications to an established wire-wound EIS
standard by International Electrotechnical Commission, 07/25/2008
IEC 61968-11 Ed. 1.0 b:2010
Application integration at electric utilities – System interfaces for distribution management – Part 11: Common information model (CIM) extensions for distribution
standard by International Electrotechnical Commission, 07/12/2010
IEC 62047-29 Ed. 1.0 en:2017
Semiconductor devices – Micro-electromechanical devices – Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
standard by International Electrotechnical Commission, 11/22/2017