IEC 62108 Ed. 2.0 b:2016
Concentrator photovoltaic (CPV) modules and assemblies – Design qualification and type approval
standard by International Electrotechnical Commission, 09/26/2016
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IEC 62005-9-4 Ed. 1.0 en:2018
Fibre optic interconnecting devices and passive components – Reliability – Part 9-4: High power qualification of passive optical components for environmental category C
standard by International Electrotechnical Commission, 07/25/2018
IEC 62047-25 Ed. 1.0 b:2016
Semiconductor devices – Micro-electromechanical devices – Part 25: Silicon based MEMS fabrication technology – Measurement method of pull-press and shearing strength of micro bonding area
standard by International Electrotechnical Commission, 08/29/2016
IEC 62137-1-5 Ed. 1.0 b:2009
Surface mounting technology – Environmental and endurance test methods for surface mount solder joints – Part 1-5: Mechanical shear fatigue test
standard by International Electrotechnical Commission, 02/11/2009
IEC 62317-13 Ed. 2.0 b:2015
Ferrite cores – Dimensions – Part 13: PQ-cores for use in power supply applications
standard by International Electrotechnical Commission, 08/20/2015
IEC 61937-7 Ed. 2.0 en:2004
Digital audio – Interface for non-linear PCM encoded audio bitstreams applying to IEC 60958 – Part 7: Non-linear PCM bitstreams according to the ATRAC, ATRAC2/3 and ATRAC-X formats
standard by International Electrotechnical Commission, 11/24/2004
IEC 62271-203 Ed. 2.0 b:2011
High-voltage switchgear and controlgear – Part 203: Gas-insulated metal-enclosed switchgear for rated voltages above 52 kV
standard by International Electrotechnical Commission, 09/07/2011
IEC 61987-92 Ed. 1.0 b:2018
Industrial-process measurement and control – Data structures and elements in process equipment catalogues – Part 92: Lists of properties (LOP) of measuring equipment for electronic data exchange – Aspect LOPs
standard by International Electrotechnical Commission, 06/05/2018
IEC 62270 Ed. 1.0 b:2004
Hydroelectric power plant automation – Guide for computer-based control
standard by International Electrotechnical Commission, 04/28/2004
IEC 62047-15 Ed. 1.0 b:2015
Semiconductor devices – Micro-electromechanical devices – Part 15: Test method of bonding strength between PDMS and glass
standard by International Electrotechnical Commission, 03/05/2015