IEC 62047-10 Ed. 1.0 b CORR1:2012
Corrigendum 1 – Semiconductor devices – Micro-electromechanical devices – Part 10: Micro-pillar compression test for MEMS materials
Corrigenda by International Electrotechnical Commission, 02/28/2012
Corrigendum 1 – Semiconductor devices – Micro-electromechanical devices – Part 10: Micro-pillar compression test for MEMS materials
Corrigenda by International Electrotechnical Commission, 02/28/2012
Installed monitors for the control and detection of gamma radiations contained in recyclable or non-recyclable materials transported by vehicles
standard by International Electrotechnical Commission, 07/28/2004
Plasma display panels – Part 2-6: Measuring methods – APL dependent gamma and colour characteristics
standard by International Electrotechnical Commission, 03/25/2015
Nuclear instrumentation – Spectrometry – Characterization of the spectrum background in HPGe gamma-ray spectrometry
standard by International Electrotechnical Commission, 12/21/2000
Heat shrinkable moulded shapes – Part 1: Definitions and general requirements
standard by International Electrotechnical Commission, 11/21/2005
Multicore and symmetrical pair/quad cables for digital communications to be used in harsh environments – Part 1: Generic specification
standard by International Electrotechnical Commission, 02/17/2004
High-voltage switchgear and controlgear – Part 102: Alternating current disconnectors and earthing switches
standard by International Electrotechnical Commission, 12/19/2001
Fibre optic active components and devices – Package and interface standards – Part 12: Laser transmitters with a coaxial RF connector
standard by International Electrotechnical Commission, 02/09/2004
Amendment 1 – High-voltage switchgear and controlgear – Part 100: High-voltage alternating-current circuit-breakers
Amendment by International Electrotechnical Commission, 05/07/2002
Maritime navigation and radiocommunication equipment and systems – Shipborne voyage data recorder (VDR) – Part 1: Voyage data recorder (VDR) – Performance requirements, methods of testing and required test results
standard by International Electrotechnical Commission, 11/21/2007