IEC 62149-6 Ed. 1.0 b:2003
Fibre optic active components and devices – Performance standards – Part 6: 650-nm 250-Mbit/s plastic optical fibre transceivers
standard by International Electrotechnical Commission, 09/04/2003
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IEC 62053-61 Ed. 1.0 b:1998
Electricity metering equipment (a.c.) – Particular requirements – Part 61: Power consumption and voltage requirements
standard by International Electrotechnical Commission, 02/12/1998
IEC 62505-2 Ed. 1.0 b:2009
Railway applications – Fixed installations – Particular requirements for a.c. switchgear – Part 2: Single-phase disconnectors, earthing switches and switches with <i>U</i><sub>n</sub> above 1 kV
standard by International Electrotechnical Commission, 03/10/2009
IEC 62317-2 Ed. 1.0 b:2010
Ferrite cores – Dimensions – Part 2: Pot-cores for use in telecommunications, power supply, and filter applications
standard by International Electrotechnical Commission, 06/24/2010
IEC 62047-1 Ed. 2.0 b:2016
Semiconductor devices – Micro-electromechanical devices – Part 1: Terms and definitions
standard by International Electrotechnical Commission, 01/06/2016
IEC 62153-4-4 Ed. 1.0 en:2006
Metallic communication cable test methods – Part 4-4: Electromagnetic compatibility (EMC) – Shielded screening attenuation, test method for measuring of the screening attenuation as up to and above 3 GHz
standard by International Electrotechnical Commission, 05/09/2006
IEC 62504 Ed. 1.1 b:2018
General lighting – Light emitting diode (LED) products and related equipment – Terms and definitions CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/13/2018
IEC 62273-1 Ed. 1.0 en:2007
Methods of measurement for radio transmitters – Part 1: Performance characteristics of terrestrial digital television transmitters
standard by International Electrotechnical Commission, 02/16/2007
IEC 62061 Amd.1 Ed. 1.0 b:2012
Amendment 1 – Safety of machinery – Functional safety of safety-related electrical, electronic and programmable electronic control systems
Amendment by International Electrotechnical Commission, 11/13/2012
IEC 62047-2 Ed. 1.0 b:2006
Semiconductor devices – Micro-electromechanical devices – Part 2: Tensile testing method of thin film materials
standard by International Electrotechnical Commission, 08/15/2006