IEC 62271-101 Amd.1 Ed. 1.0 b:2010
Amendment 1 – High-voltage switchgear and controlgear – Part 101: Synthetic testing
Amendment by International Electrotechnical Commission, 05/11/2010
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IEC 62137-1-1 Ed. 1.0 b:2007
Surface mounting technology – Environmental and endurance test methods for surface mount solder joint – Part 1-1: Pull strength test
standard by International Electrotechnical Commission, 07/11/2007
IEC 62153-4-7 Ed. 2.0 b:2015
Metallic communication cable test methods – Part 4-7: Electromagnetic compatibility (EMC) – Test method for measuring of transfer impedance Z<sub>T</sub> and screening attenuation a<sub>S</sub> or coupling attenuation a<sub>C</sub> of connectors and assemblies up to and above 3 GHz – Triaxial tube i
standard by International Electrotechnical Commission, 12/09/2015
IEC 62105 Ed. 1.0 b:1999
Digital audio broadcast system – Specification of the receiver data interface (RDI)
standard by International Electrotechnical Commission, 12/10/1999
IEC 62226-1 Ed. 1.0 b:2004
Exposure to electric or magnetic fields in the low and intermediate frequency range – Methods for calculating the current density and internal electric field induced in the human body – Part 1: General
standard by International Electrotechnical Commission, 11/10/2004
IEC 62317-4 Ed. 1.0 en:2005
Ferrite cores – Dimensions – Part 4: RM-cores and associated parts
standard by International Electrotechnical Commission, 09/23/2005
IEC 62642-6 Ed. 1.0 b:2011
Alarm systems – Intrusion and hold-up systems – Part 6: Power supplies
standard by International Electrotechnical Commission, 02/10/2011
IEC 62541-5 Ed. 1.0 b:2011
OPC unified architecture – Part 5: Information Model
standard by International Electrotechnical Commission, 10/18/2011
IEC 62271-100 Amd.2 Ed. 1.0 b:2006
Amendment 2 – High-voltage switchgear and controlgear – Part 100: High-voltage alternating-current circuit-breakers
Amendment by International Electrotechnical Commission, 07/24/2006
IEC 62435-4 Ed. 1.0 en:2018
Electronic components – Long-term storage of electronic semiconductor devices – Part 4: Storage
standard by International Electrotechnical Commission, 06/05/2018