
IEC 62381 Ed. 1.0 en:2006
Automation systems in the process industry – Factory acceptance test (FAT), site acceptance test (SAT), and site integration test (SIT)
standard by International Electrotechnical Commission, 11/15/2006
Automation systems in the process industry – Factory acceptance test (FAT), site acceptance test (SAT), and site integration test (SIT)
standard by International Electrotechnical Commission, 11/15/2006
Triggering messages for broadcast applications – Part 1: Format
standard by International Electrotechnical Commission, 05/03/2005
Metallic cables and other passive components – Test methods ¿¿¿ Part 4-17: Electromagnetic compatibility (EMC) – Reduction Factor
standard by International Electrotechnical Commission, 08/15/2018
Universal Serial Bus interfaces for data and power – Part 1-4: Common components – USB Type-C¿¿¿ Authentication Specification
standard by International Electrotechnical Commission, 04/10/2018
Maritime navigation and radiocommunication equipment and systems – Class B shipborne equipment of the automatic identification system (AIS) – Part 1: Carrier-sense time division multiple access (CSTDMA) techniques
standard by International Electrotechnical Commission, 11/25/2010
Integrated circuits – Measurement of impulse immunity – Part 3: Non-synchronous transient injection method
standard by International Electrotechnical Commission, 07/17/2013
High frequency inductive components – Part 1: Fixed surface mount inductors for use in electronic and telecommunication equipment
standard by International Electrotechnical Commission, 10/12/2012
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
standard by International Electrotechnical Commission, 11/07/2007
Optical circuit boards – Part 3-1: Performance standards – Flexible optical circuit boards using unconnectorized optical glass fibres
standard by International Electrotechnical Commission, 08/18/2009
Consumer audio/video equipment digital interface with plastic optical fibre
standard by International Electrotechnical Commission, 11/23/2004