IEC 62047-40 Ed. 1.0 en:2021
Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
standard by International Electrotechnical Commission, 09/01/2021
Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
standard by International Electrotechnical Commission, 09/01/2021
Wearable electronic devices and technologies – Part 406-1: Test method for measuring surface temperature of wrist-worn wearable electronic devices while in contact with human skin
standard by International Electrotechnical Commission, 12/01/2021
Electromagnetic compatibility (EMC) – Part 3-2: Limits – Limits for harmonic current emissions (equipment input current 16 A per phase) CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 07/01/2020
Medical electrical equipment – Part 2-63: Particular requirements for the basic safety and essential performance of dental extra-oral X-ray equipment CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 05/01/2021
Cable cleats for electrical installations
standard by International Electrotechnical Commission, 10/01/2021
Semiconductor devices – Mechanical and climatic test methods – Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
standard by International Electrotechnical Commission, 11/01/2021
Digital audio interface – Part 1: General
standard by International Electrotechnical Commission, 09/01/2021
Wind turbines – Part 13: Measurement of mechanical loads CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 12/01/2021
Amendment 4 – International Electrotechnical Vocabulary (IEV) – Part 103: Mathematics – Functions
Amendment by International Electrotechnical Commission, 09/01/2021
Fixed inductors for electromagnetic interference suppression – Part 2: Sectional specification on power line chokes
standard by International Electrotechnical Commission, 07/01/2021