IEEE 1500-2005
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
standard by IEEE, 08/29/2005
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IEEE 1226.2-1993
IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))
standard by IEEE, 04/12/1994
IEEE 1573-2003
IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
standard by IEEE, 03/31/2004
IEEE 1407-1998
IEEE Guide for Accelerated Aging Tests for Medium-Voltage Extruded Electric Power Cables Using Water-Filled Tanks
standard by IEEE, 04/07/1999
IEEE 16-2004
IEEE Standard for Electrical and Electronic Control Apparatus on Rail Vehicles
standard by IEEE, 03/25/2005
IEEE 1450.6.1-2009
IEEE Standard for Describing On-Chip Scan Compression
standard by IEEE, 07/13/2009
IEEE 1232.1-1997
IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification
standard by IEEE, 09/05/1997
IEEE 1283-2004
IEEE Guide for Determining the Effects of High Temperature Operation on Conductors, Connectors, and Accessories
standard by IEEE, 03/23/2005
IEEE 11073-10207-2017
IEEE Health informatics–Point-of-care medical device communication Part 10207: Domain Information and Service Model for Service-Oriented Point-of-Care Medical Device Communication
standard by IEEE, 02/21/2018
IEEE 1619-2018
IEEE Standard for Cryptographic Protection of Data on Block-Oriented Storage Devices
standard by IEEE, 01/25/2019