
JEDEC JEP174
UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
standard by JEDEC Solid State Technology Association, 09/01/2016
UNDERSTANDING ELECTRICAL OVERSTRESS – EOS
standard by JEDEC Solid State Technology Association, 09/01/2016
CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 10/01/2007
LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS
standard by JEDEC Solid State Technology Association, 04/01/1982
Graphics Double Data Rate (GDDR5) SGRAM Standard
standard by JEDEC Solid State Technology Association, 09/01/2013
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 03/01/2017
INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2000
SON/QFN PACKAGE PINOUTS STANDARDIZED FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 07/01/2004
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 10/01/2006
GUIDELINES FOR PREPARING CUSTOMER-SUPPLIED BACKGROUND INFORMATION RELATING TO A SEMICONDUCTOR-DEVICE FAILURE ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/1998