JEDEC JESD22-B116A
WIRE BOND SHEAR TEST
standard by JEDEC Solid State Technology Association, 08/01/2009
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JEDEC JESD 12-3
ADDENDUM No. 3 to JESD12 – CMOS GATE ARRAY MACROCELL STANDARD
Amendment by JEDEC Solid State Technology Association, 06/01/1986
JEDEC JESD22-A100C
CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 10/01/2007
JEDEC JESD 22-A110C
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
standard by JEDEC Solid State Technology Association, 01/01/2009
JEDEC JEP001-1A
FOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018
JEDEC JESD235
HIGH BANDWIDTH MEMORY (HBM) DRAM
standard by JEDEC Solid State Technology Association, 10/01/2013
JEDEC JESD22-A102E
ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 07/01/2015
JEDEC JESD 36
STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 06/01/1996
