JEDEC JEP001-1A
FOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018
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JEDEC JESD204B.01
Serial Interface for Data Converters
standard by JEDEC Solid State Technology Association, 01/01/2012
JEDEC JEP709
A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD57
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996
JEDEC JEB 15
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 11/01/1969
JEDEC JEP144
GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 07/01/2002
JEDEC JESD64-A
STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTS
standard by JEDEC Solid State Technology Association, 10/01/2000
JEDEC JESD22-B110B.01
Mechanical Shock – Device and Subassembly
standard by JEDEC Solid State Technology Association, 06/01/2019
JEDEC JEP149
APPLICATION THERMAL DERATING METHODOLOGIES
standard by JEDEC Solid State Technology Association, 11/01/2004