Side Navigation

X

JEDEC JESD57

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996

JEDEC JEB 15

TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 11/01/1969

JEDEC JEP144

GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
standard by JEDEC Solid State Technology Association, 07/01/2002

JEDEC JESD64-A

STANDARD FOR DESCRIPTION OF 2.5 V CMOS LOGIC DEVICES WITH 3.6 V CMOS TOLERANT INPUTS AND OUTPUTS
standard by JEDEC Solid State Technology Association, 10/01/2000

JEDEC JEP709

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 11/01/2010

JEDEC JESD3-C

STANDARD DATA TRANSFER FORMAT BETWEEN DATA PREPARATION SYSTEM AND PROGRAMMABLE LOGIC DEVICE PROGRAMMER
standard by JEDEC Solid State Technology Association, 06/01/1994