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JEDEC JESD70

2.5 V BiCMOS LOGIC DEVICE FAMILY SPECIFICATION WITH 5 V TOLERANT INPUTS AND OUTPUTS
standard by JEDEC Solid State Technology Association, 06/01/1999

JEDEC JESD51

METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995

JEDEC JESD51-5

EXTENSION OF THERMAL TEST BOARD STANDARDS FOR PACKAGES WITH DIRECT THERMAL ATTACHMENT MECHANISMS
standard by JEDEC Solid State Technology Association, 02/01/1999

JEDEC JS709B

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 04/01/2015

JEDEC JESD22-A117D

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JEP001-3A

FOUNDRY PROCESS QUALIFICATION GUIDELINES – PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 09/01/2018