JEDEC JESD79-3-1A
Addendum No. 1 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 01/01/2013
Addendum No. 1 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 01/01/2013
FBDIMM SPECIFICATION: HIGH SPEED DIFFERENTIAL PTP LINK AT 1.5 V
standard by JEDEC Solid State Technology Association, 03/01/2008
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 03/01/2010
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
standard by JEDEC Solid State Technology Association, 12/01/2015
STANDARD DESCRIPTION OF 1.2 V CMOS LOGIC DEVICES (NORMAL RANGE OPERATION)
standard by JEDEC Solid State Technology Association, 06/01/2001
Embedded Multi-media card (e*MMC), Electrical Standard (5.01)
standard by JEDEC Solid State Technology Association, 07/01/2014
1.2 V +/- 0.1 V (NORMAL RANGE) AND 0.8 – 1.3 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
Addendum No. 1 to JESD209A – LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM, 1.2 V I/O
standard by JEDEC Solid State Technology Association, 03/01/2009
PROCESS CHARACTERIZATION GUIDELINE
standard by JEDEC Solid State Technology Association, 08/01/2018
LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 02/01/2010