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JEDEC JEP156

CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JESD82-16A

DEFINITION OF THE SSTUA32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY TEST FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD241

Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
standard by JEDEC Solid State Technology Association, 12/01/2015

JEDEC J-STD-033C

JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 12/01/2011

JEDEC JP001.01

FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 05/01/2004

JEDEC JEP147

PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)
standard by JEDEC Solid State Technology Association, 10/01/2003

JEDEC JESD223

Universal Flash Storage (UFS) Host Controller Interface
standard by JEDEC Solid State Technology Association, 08/01/2011

JEDEC JEB 19

RECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS
standard by JEDEC Solid State Technology Association, 11/01/1972