JEDEC JEP131A
PROCESS FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
standard by JEDEC Solid State Technology Association, 05/01/2005
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JEDEC JESD 22-A117B
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 03/01/2009
JEDEC JESD 12-1B
ADDENDUM No. 1 to JESD12 – TERMS AND DEFINITIONS FOR GATE ARRAYS AND CELL-BASED INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 08/01/1993
JEDEC JESD22-A117C
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 10/01/2011
JEDEC JS709
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 08/01/2011
JEDEC JESD8-13
SCALABLE LOW-VOLTAGE SIGNALING FOR 400 MV (SLVS-400)
standard by JEDEC Solid State Technology Association, 10/01/2001
JEDEC JESD71
STANDARD TEST AND PROGRAMMING LANGUAGE (STAPL)
standard by JEDEC Solid State Technology Association, 08/01/1999
JEDEC JESD46D
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS
standard by JEDEC Solid State Technology Association,
JEDEC JESD49A (R2009)
PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD)
standard by JEDEC Solid State Technology Association, 09/01/2005
JEDEC JESD22-A101D
STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2015