JEDEC JEP160
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
standard by JEDEC Solid State Technology Association, 11/01/2011
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
standard by JEDEC Solid State Technology Association, 11/01/2011
GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS
standard by JEDEC Solid State Technology Association, 07/01/1988
PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE
standard by JEDEC Solid State Technology Association, 11/01/1969
DEFINITION OF THE SSTUB32868 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES
standard by JEDEC Solid State Technology Association, 03/01/2014
GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
standard by JEDEC Solid State Technology Association, 10/01/2007
GUIDELINES FOR PACKING AND LABELING OF INTEGRATED CIRCUITS IN UNIT CONTAINER PACKING
standard by JEDEC Solid State Technology Association, 02/01/2006
LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES
standard by JEDEC Solid State Technology Association, 08/01/1984
System Level ESD Part II: Implementation of Effective ESD Robust Designs
standard by JEDEC Solid State Technology Association, 09/01/2019
ADDENDUM No. 5 to JESD12 – DESIGN FOR TESTABILITY GUIDELINES
Amendment by JEDEC Solid State Technology Association, 08/01/1988