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JEDEC JESD 12-1B

ADDENDUM No. 1 to JESD12 – TERMS AND DEFINITIONS FOR GATE ARRAYS AND CELL-BASED INTEGRATED CIRCUITS
Amendment by JEDEC Solid State Technology Association, 08/01/1993

JEDEC JESD22-A117C

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 10/01/2011

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007

JEDEC JESD211

ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
standard by JEDEC Solid State Technology Association, 12/01/2009

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015

JEDEC J-STD-033B.1

JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFACE-MOUNT DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2007

JEDEC JS 9703

IPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability
standard by JEDEC Solid State Technology Association, 03/01/2009

JEDEC JESD223B

Universal Flash Storage Host Controller Interface (UFSHCI)
standard by JEDEC Solid State Technology Association, 09/01/2013