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JEDEC JESD531 (R2002)

THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)
standard by JEDEC Solid State Technology Association, 07/01/1986

JEDEC JEP128

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
standard by JEDEC Solid State Technology Association, 11/01/1996

JEDEC JESD82-14A

DEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/2006

JEDEC JESD51-7

HIGH EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES
standard by JEDEC Solid State Technology Association, 02/01/1999

JEDEC JESD51-6

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – FORCED CONVECTION (MOVING AIR)
standard by JEDEC Solid State Technology Association, 03/01/1999