JEDEC JESD 24-10 (R2002)
ADDENDUM No. 10 to JESD24 – TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES
Amendment by JEDEC Solid State Technology Association, 08/01/1994
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JEDEC J-STD-048
Notification Standard for Product Discontinuance
standard by JEDEC Solid State Technology Association, 11/01/2014
JEDEC JESD15-1
COMPACT THERMAL MODEL OVERVIEW
standard by JEDEC Solid State Technology Association, 10/01/2008
JEDEC JEP150.01
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 06/01/2013
JEDEC JESD 79-3E
DDR3 SDRAM STANDARD
standard by JEDEC Solid State Technology Association, 07/01/2010
JEDEC JEP122G
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2011
JEDEC JEP133C
GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/2010
JEDEC JESD 209-2D
LOW POWER DOUBLE DATA RATE 2 (LPDDR2)
standard by JEDEC Solid State Technology Association, 12/01/2010
JEDEC JEP116
CMOS SEMICUSTOM DESIGN GUIDELINES
standard by JEDEC Solid State Technology Association, 11/01/1991
JEDEC JEB 5-A (R1984)
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 01/01/1970