JEDEC JESD28-A
A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 12/01/2001
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JEDEC JESD99C
Terms, Definitions, and Letter Symbols for Microelectronic Devices
standard by JEDEC Solid State Technology Association, 12/01/2012
JEDEC J-STD-609
MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES
standard by JEDEC Solid State Technology Association, 05/01/2007
JEDEC JESD47I.01
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 10/01/2016
JEDEC JESD72A
TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
standard by JEDEC Solid State Technology Association, 03/01/2018
JEDEC JESD30H
Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JEP138
USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
standard by JEDEC Solid State Technology Association, 09/01/1999
JEDEC JESD 82-23
DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
JEDEC JESD75-6
PSO-N/PQFN PINOUTS STANDARDIZED FOR 14-, 16-, 20-, AND 24-LEAD LOGIC FUNCTIONS
standard by JEDEC Solid State Technology Association, 03/01/2006
JEDEC JESD79-4-1
Addendum No. 1 to JESD79-4, 3D Stacked DRAM Standard
Amendment by JEDEC Solid State Technology Association, 02/01/2017