PHYSICAL DIMENSION
standard by JEDEC Solid State Technology Association, 06/01/2003
DEFINITION OF THE SSTVN16859 2.5-2.6 V 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR PC1600, PC2100, PC2700 AND PC3200 DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2005
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) – COMPONENT LEVEL
standard by JEDEC Solid State Technology Association, 04/01/2010
INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
PROCESS CHARACTERIZATION GUIDELINE
standard by JEDEC Solid State Technology Association, 07/01/1998
STATISTICAL PROCESS CONTROL SYSTEMS
standard by JEDEC Solid State Technology Association, 02/01/2006
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
standard by JEDEC Solid State Technology Association, 08/01/2010
1.8 V HIGH-SPEED LVCMOS (HS_LVCMOS) INTERFACE
standard by JEDEC Solid State Technology Association, 03/01/2018
QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013