• 2019-12-29
• Admin
• no comments

JEDEC JEP159

PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
standard by JEDEC Solid State Technology Association, 08/01/2010

• 2019-12-29
• Admin
• no comments

JEDEC JESD8-31

1.8 V HIGH-SPEED LVCMOS (HS_LVCMOS) INTERFACE
standard by JEDEC Solid State Technology Association, 03/01/2018

• 2019-12-29
• Admin
• no comments

JEDEC JESD670A

QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013

• 2019-12-29
• Admin
• no comments

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1966

• 2019-12-29
• Admin
• no comments

JEDEC JESD47J.01

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2017

• 2019-12-29
• Admin
• no comments

JEDEC JESD235B

HIgh Bandwidth Memory DRAM (HBM1, HBM2)
standard by JEDEC Solid State Technology Association, 11/01/2018

• 2019-12-29
• Admin
• no comments

JEDEC JESD63

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE
standard by JEDEC Solid State Technology Association, 02/01/1998

• 2019-12-29
• Admin
• no comments

JEDEC JESD218B

SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 03/01/2016

• 2019-12-29
• Admin
• no comments

JEDEC JEP136

SIGNATURE ANALYSIS
standard by JEDEC Solid State Technology Association, 07/01/1999

• 2019-12-29
• Admin
• no comments

JEDEC JESD22-B100B (R2016)

PHYSICAL DIMENSION
standard by JEDEC Solid State Technology Association, 06/01/2003