JEDEC JESD 82-13A
DEFINITION OF THE SSTVN16859 2.5-2.6 V 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR PC1600, PC2100, PC2700 AND PC3200 DDR DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2005
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JEDEC JESD60A
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004
JEDEC JESD38
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
standard by JEDEC Solid State Technology Association, 12/01/1995
JEDEC JEP148B
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014
JEDEC JESD245A
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2016
JEDEC JESD243
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
standard by JEDEC Solid State Technology Association, 03/01/2016
JEDEC JESD 22-A111
EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2004
JEDEC JESD659C
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 04/01/2017
JEDEC JEP78
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
standard by JEDEC Solid State Technology Association, 10/01/1969
JEDEC JESD 320-A (R2002)
CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS
standard by JEDEC Solid State Technology Association, 12/01/1992