JEDEC JESD47J.01
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2017
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JEDEC JEP78
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
standard by JEDEC Solid State Technology Association, 10/01/1969
JEDEC JESD 320-A (R2002)
CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS
standard by JEDEC Solid State Technology Association, 12/01/1992
JEDEC JESD 23
TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: Â
standard by JEDEC Solid State Technology Association, 05/01/1982
JEDEC JESD13-B
STANDARD SPECIFICATION FOR DESCRIPTION OF B SERIES CMOS DEVICES
standard by JEDEC Solid State Technology Association, 05/01/1980
JEDEC JESD60A
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004
JEDEC JESD38
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
standard by JEDEC Solid State Technology Association, 12/01/1995
JEDEC JEP148B
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 01/01/2014
JEDEC JESD245A
Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 09/01/2016
JEDEC JESD243
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
standard by JEDEC Solid State Technology Association, 03/01/2016