JEDEC JESD47J.01
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2017
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JEDEC JESD243
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
standard by JEDEC Solid State Technology Association, 03/01/2016
JEDEC JESD 22-A111
EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2004
JEDEC JESD659C
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 04/01/2017
JEDEC JEP78
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS
standard by JEDEC Solid State Technology Association, 10/01/1969
JEDEC JESD 320-A (R2002)
CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS
standard by JEDEC Solid State Technology Association, 12/01/1992
JEDEC JESD 23
TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: Â
standard by JEDEC Solid State Technology Association, 05/01/1982
JEDEC JESD13-B
STANDARD SPECIFICATION FOR DESCRIPTION OF B SERIES CMOS DEVICES
standard by JEDEC Solid State Technology Association, 05/01/1980
JEDEC JESD60A
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS
standard by JEDEC Solid State Technology Association, 09/01/2004
JEDEC JESD38
STANDARD FOR FAILURE ANALYSIS REPORT FORMAT
standard by JEDEC Solid State Technology Association, 12/01/1995