JEDEC JEP172
DISCONTINUING USE OF THE MACHINE MODEL FOR DEVICE ESD QUALIFICATION
standard by JEDEC Solid State Technology Association, 07/01/2014
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JEDEC JEP140 (R2006)
BEADED THERMOCOUPLE TEMPERATURE MEASUREMENT OF SEMICONDUCTOR PACKAGES
standard by JEDEC Solid State Technology Association, 06/01/2002
JEDEC JESD22-A104D
TEMPERATURE CYCLING
standard by JEDEC Solid State Technology Association, 03/01/2009
JEDEC JESD 209B
LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD
standard by JEDEC Solid State Technology Association, 02/01/2010
JEDEC JESD 381-A (R2002)
METHOD OF DIODE Q MEASUREMENT
standard by JEDEC Solid State Technology Association, 11/01/1981
JEDEC JEP 122E
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009
JEDEC JESD22-A119 (R2009)
LOW TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JESD22-B106D
RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES
standard by JEDEC Solid State Technology Association, 04/01/2008
JEDEC JESD 24-3
ADDENDUM No. 3 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR VERTICAL POWER MOSFETS (DELTA SOURCE-DRAIN VOLTAGE METHOD)
Amendment by JEDEC Solid State Technology Association, 11/01/1990
JEDEC JESD8-30A
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019