
JEDEC JEP 122E
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/2009
THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD
standard by JEDEC Solid State Technology Association, 04/01/1968
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
standard by JEDEC Solid State Technology Association, 12/01/2016
RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013
TRANSISTOR, GALLIUM ARSENIDE POWER FET, GENERIC SPECIFICATION
standard by JEDEC Solid State Technology Association, 07/01/1992
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2012
NAND Flash Interface Interoperability
standard by JEDEC Solid State Technology Association, 07/01/2014
RECOMMENDED ESD-CDM TARGET LEVELS
standard by JEDEC Solid State Technology Association, 10/01/2009
STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1996
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 06/01/2012