JEDEC JESD8-30A
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
POD125 – 1.25 V Pseudo Open Drain I/O
standard by JEDEC Solid State Technology Association, 06/01/2019
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
standard by JEDEC Solid State Technology Association, 12/01/2016
RF Biased Life (RFBL) Test Method
standard by JEDEC Solid State Technology Association, 01/01/2013
TRANSISTOR, GALLIUM ARSENIDE POWER FET, GENERIC SPECIFICATION
standard by JEDEC Solid State Technology Association, 07/01/1992
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2012
THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD
standard by JEDEC Solid State Technology Association, 04/01/1968
Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 06/01/2012
DEFINITION OF THE SSTUB32869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
FBDIMM Architecture and Protocol
standard by JEDEC Solid State Technology Association, 01/01/2007
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2015