• 2019-12-29
• Admin
• no comments

JEDEC EIA 670

QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)
standard by JEDEC Solid State Technology Association, 06/01/1997

• 2019-12-29
• Admin
• no comments

JEDEC JESD89-1A

TEST METHOD FOR REAL-TIME SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 10/01/2007

• 2019-12-29
• Admin
• no comments

JEDEC JESD220C

Universal Flash Storage (UFS)
standard by JEDEC Solid State Technology Association, 03/01/2016

• 2019-12-29
• Admin
• no comments

JEDEC JESD99B

TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR MICROELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 05/01/2007

• 2019-12-29
• Admin
• no comments

JEDEC JESD22-B113B

BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 08/01/2018

• 2019-12-29
• Admin
• no comments

JEDEC JEP122H

Failure Mechanisms and Models for Semiconductor Devices
standard by JEDEC Solid State Technology Association, 09/01/2016

• 2019-12-29
• Admin
• no comments

JEDEC JESD224A

Universal Flash Storage (UFS) Test
standard by JEDEC Solid State Technology Association, 07/01/2017

• 2019-12-29
• Admin
• no comments

JEDEC JESD234

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
standard by JEDEC Solid State Technology Association, 10/01/2013

• 2019-12-29
• Admin
• no comments

JEDEC JESD210

AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 12/01/2007

• 2019-12-29
• Admin
• no comments

JEDEC JESD22-C101E

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009