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JEDEC JESD22-B113B

BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
standard by JEDEC Solid State Technology Association, 08/01/2018

JEDEC JEP122H

Failure Mechanisms and Models for Semiconductor Devices
standard by JEDEC Solid State Technology Association, 09/01/2016

JEDEC JESD234

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
standard by JEDEC Solid State Technology Association, 10/01/2013

JEDEC JESD210

AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
standard by JEDEC Solid State Technology Association, 12/01/2007

JEDEC JESD22-C101E

FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009

JEDEC JESD84-A441

EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)
standard by JEDEC Solid State Technology Association, 03/01/2010

JEDEC JEP179

DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION
standard by JEDEC Solid State Technology Association, 06/01/2006