JEDEC JESD22-C101E
FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 12/01/2009
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JEDEC JESD84-A441
EMBEDDED MULTIMEDIACARD(e*MMC) e*MMC/CARD PRODUCT STANDARD, HIGH CAPACITY, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)
standard by JEDEC Solid State Technology Association, 03/01/2010
JEDEC JESD340 (R2009)
STANDARD FOR THE MEASUREMENT OF CRE
standard by JEDEC Solid State Technology Association, 11/01/1967
JEDEC JEP179
DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION
standard by JEDEC Solid State Technology Association, 06/01/2006
JEDEC JESD213A
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) – LEAD (Pb) CONTENT
standard by JEDEC Solid State Technology Association, 04/01/2017
JEDEC JESD209-3B
Low Power Double Data Rate 3 SDRAM (LPDDR3)
standard by JEDEC Solid State Technology Association, 08/01/2013
JEDEC JEP130B
GUIDELINES FOR PACKING AND LABELING OF INTEGRATED CIRCUITS IN UNIT CONTAINER PACKING (TUBES, TRAYS, AND TAPE AND REEL)
standard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JS709C
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
standard by JEDEC Solid State Technology Association, 03/01/2018
JEDEC JESD229
Wide I/O Single Data Rate (Wide I/O SDR)
standard by JEDEC Solid State Technology Association, 12/01/2011
JEDEC JS709A
JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 05/01/2012