JEDEC JESD 82-25
DEFINITION OF the SSTUB32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 05/01/2007
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JEDEC JEP139
GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
standard by JEDEC Solid State Technology Association, 12/01/2000
JEDEC JESD218B.01
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
standard by JEDEC Solid State Technology Association, 06/01/2016
JEDEC JESD 236-C (R2009)
COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 03/01/1986
JEDEC JEP 148A
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
standard by JEDEC Solid State Technology Association, 12/01/2008
JEDEC JESD51-51
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
standard by JEDEC Solid State Technology Association, 04/18/2012
JEDEC JESD50C
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
standard by JEDEC Solid State Technology Association, 01/01/2018
JEDEC JESD302 (R2009)
RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE
standard by JEDEC Solid State Technology Association, 01/01/1965
JEDEC JESD8-21B
POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 03/01/2018
JEDEC JESD82-18A
STANDARD FOR DEFINITION OF THE CUA877 AND CU2A877 PLL CLOCK DRIVERSFOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007