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JEDEC JESD51-14

INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATH
standard by JEDEC Solid State Technology Association, 11/01/2010

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JEDEC JESD 24

POWER MOSFETS
standard by JEDEC Solid State Technology Association, 07/01/1985

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JEDEC JESD30E

DESCRIPTIVE DESIGNATION SYSTEM FOR SEMICONDUCTOR-DEVICE PACKAGES
standard by JEDEC Solid State Technology Association, 08/01/2008

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JEDEC JEP176

ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
standard by JEDEC Solid State Technology Association, 01/01/2018

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JEDEC JESD22-A108E

TEMPERATURE, BIAS, AND OPERATING LIFE
standard by JEDEC Solid State Technology Association, 12/01/2016

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JEDEC JESD 78B

IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 12/01/2008

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JEDEC JESD51-12.01

GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION
standard by JEDEC Solid State Technology Association, 11/01/2012

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JEDEC JESD220-1

Universal Flash Storage (UFS) Unified Memory Extention
standard by JEDEC Solid State Technology Association, 09/01/2013

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JEDEC JESD22-B101B

EXTERNAL VISUAL
standard by JEDEC Solid State Technology Association, 08/01/2009

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JEDEC JEP65 (R1999)

TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 12/01/1967