JEDEC JESD 22-B107C
MARKING PERMANENCY
standard by JEDEC Solid State Technology Association, 09/01/2004
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JEDEC JESD209-4-1
Addendum No. 1 to JESD209-4 – Low Power Double Data Rate 4 (LPDDR4)
Amendment by JEDEC Solid State Technology Association, 01/01/2017
JEDEC JESD 12-2
ADDENDUM No. 2 to JESD12 – STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET
Amendment by JEDEC Solid State Technology Association, 02/01/1986
JEDEC JESD22-B104C (R2009)
MECHANICAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2004
JEDEC JEP84A
RECOMMENDED PRACTICE FOR MEASUREMENT OF TRANSISTOR LEAD TEMPERATURE
standard by JEDEC Solid State Technology Association, 06/01/2004
JEDEC JESD 47G.01
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 04/01/2010
JEDEC JESD204A
SERIAL INTERFACE FOR DATA CONVERTERS
standard by JEDEC Solid State Technology Association, 04/01/2008
JEDEC JEP131C
Potential Failure Mode and Effects Analysis (FMEA)
standard by JEDEC Solid State Technology Association, 08/01/2018
JEDEC JESD 370B (R2003)
DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 02/01/1982