JEDEC JESD69B
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2007
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
standard by JEDEC Solid State Technology Association, 10/01/2007
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003
STANDARD LOGNORMAL ANALYSIS OF UNCENSORED DATA, AND OF SINGLY RIGHT -CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD
standard by JEDEC Solid State Technology Association, 10/01/1992
JEDEC Dictionary of Terms for Solid-State Technology, Sixth Edition
standard by JEDEC Solid State Technology Association, 06/01/2013
THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 10/01/1975
PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
standard by JEDEC Solid State Technology Association, 03/01/2010
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
standard by JEDEC Solid State Technology Association, 08/01/2017
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES
standard by JEDEC Solid State Technology Association, 07/01/2014
THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS
standard by JEDEC Solid State Technology Association, 05/01/1970