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JEDEC JESD22-B118
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
standard by JEDEC Solid State Technology Association, 03/01/2011
JEDEC JESD 24-6 (R2002)
ADDENDUM No. 6 to JESD24 – THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 10/01/2001
JEDEC JESD 82-29A
DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS
standard by JEDEC Solid State Technology Association, 12/01/2010
JEDEC JESD 48B
PRODUCT DISCONTINUANCE
standard by JEDEC Solid State Technology Association, 05/01/2005
JEDEC JESD22-A104E
TEMPERATURE CYCLING
standard by JEDEC Solid State Technology Association, 10/01/2014
JEDEC JESD84-B50
Embedded Multi-media card (e*MMC), Electrical Standard 5.0
standard by JEDEC Solid State Technology Association, 09/01/2013
JEDEC JESD69C
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
standard by JEDEC Solid State Technology Association, 11/01/2017
JEDEC JESD216C
SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)
standard by JEDEC Solid State Technology Association,
JEDEC JESD8-21A
POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 09/01/2013