Side Navigation

X

JEDEC JESD51-53

TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING
standard by JEDEC Solid State Technology Association, 05/01/2012

JEDEC JESD419-A (R2001)

STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMAT
standard by JEDEC Solid State Technology Association, 10/01/1980

JEDEC JESD4 (R2002)

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES
standard by JEDEC Solid State Technology Association, 11/01/1983

JEDEC JESD51-2A

INTEGRATED CIRCUITS THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – NATURAL CONVECTION (STILL AIR)
standard by JEDEC Solid State Technology Association, 01/01/2007

JEDEC JESD87

STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS
standard by JEDEC Solid State Technology Association, 07/01/2001

JEDEC JESD30G

Descriptive Designation System for Semiconductor-device Packages
standard by JEDEC Solid State Technology Association, 01/01/2016

JEDEC JS-001-2017

ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing – Human Body Modal (HBM) – Component Level
standard by JEDEC Solid State Technology Association, 05/12/2017