PROCEDURE FOR CHARACTERIZING TIME-DEPENDENT DIELECTRIC BREAKDOWN OF ULTRA-THIN GATE DIELECTRICS
standard by JEDEC Solid State Technology Association, 08/01/2003
TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 10/01/2007
HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT
standard by JEDEC Solid State Technology Association, 04/01/2014
Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)
standard by JEDEC Solid State Technology Association, 06/01/2011
POD135 – 1.35 V PSEUDO OPEN DRAIN I/O
standard by JEDEC Solid State Technology Association, 07/01/2010
RADIO FRONT END – BASEBAND (RF-BB) INTERFACE
standard by JEDEC Solid State Technology Association, 02/01/2006
ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) – Device Level
standard by JEDEC Solid State Technology Association, 04/07/2015
IPC/JEDEC-9704: Printed Wiring Board (PWB) Strain Gage Test Guideline
standard by JEDEC Solid State Technology Association, 06/01/2005