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JEDEC JESD22-A117E

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 11/01/2018

• 2019-12-29
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JEDEC JESD22-A115C

ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
standard by JEDEC Solid State Technology Association, 11/01/2010

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JEDEC JEP 155

RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
standard by JEDEC Solid State Technology Association, 08/01/2008

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JEDEC JESD2

DIGITAL BIPOLAR LOGIC PINOUTS FOR CHIP CARRIERS
standard by JEDEC Solid State Technology Association, 12/01/1982

• 2019-12-29
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JEDEC JESD 22-A118 (R2008)

ACCELERATED MOISTURE RESISTANCE – UNBIASED HAST
standard by JEDEC Solid State Technology Association, 12/01/2000

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JEDEC JESD22-A118A

ACCELERATED MOISTURE RESISTANCE – UNBIASED HAST
standard by JEDEC Solid State Technology Association, 03/01/2011

• 2019-12-29
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JEDEC JESD227

EMBEDDED MULTIMEDIACARD (e-MMC) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016

• 2019-12-29
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JEDEC JESD220-2A

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION
standard by JEDEC Solid State Technology Association, 01/01/2018

• 2019-12-29
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JEDEC JESD22-A106B.01

THERMAL SHOCK
standard by JEDEC Solid State Technology Association, 11/01/2016

• 2019-12-29
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JEDEC JEP 79

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
standard by JEDEC Solid State Technology Association, 09/01/1969