JIS C 6185:2008
Test methods of optical time domain reflectometer
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2008
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JIS C 5901:2001
Test methods of passive devices for fibre optic transmission (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2001
JIS C 5402-23-3:2005
Electromechanical components for electronic equipment — Basic testing procedures and measuring methods — Part 23-3: Test 23c: Shielding effectiveness of connectors and accessories (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005
JIS C 5201-2:1998
Fixed resistors for use in electronic equipment. Part 2: Sectional specification: Fixed low-power non-wirewound resistors
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
JIS C 5101-1:1998
Fixed capacitors for use in electronic equipment. Part 1: Generic specification
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
JIS B 8605:1999
Stop valves for refrigerants (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1999
JIS C 7032:1993
General rules for transistors
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1993
JIS C 5201-8-1:1998
Fixed resistors for use in electronic equipment. Part 8: Blank detail specification: Fixed chip resistors. Assessment level E
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
JIS B 9941:1987
Testing methods of precipitation equipments (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1987
JIS C 60721-1:2009
Classification of environmental conditions — Part 1: Environmental parameters and their severities (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2009