1.1”This test method covers determination of ductility utilizing Epstein test strips and a bending device for bending the strip over a predetermined radius. It is intended for commercial silicon-bearing steel sheet or strip of nonoriented types in the thickness range from 0.010 to 0.031 in. [0.25 to 0.79 mm], inclusive.

Product Details

Published:

06/01/2021

Number of Pages:

2

File Size:

1 file , 80 KB