IEC 61649 Ed. 1.0 b:1997

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Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

Product Details

Edition:

1.0

Published:

05/16/1997

Number of Pages:

31

File Size:

1 file , 150 KB