IEC 62373-1 Ed. 1.0 b:2020

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IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).

This document also defines the terms pertaining to the conventional BTI test method.

Product Details

Edition:

1.0

Published:

07/15/2020

Number of Pages:

44

File Size:

1 file , 1.7 MB