IEC 62416 Ed. 1.0 b:2010

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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Product Details

Edition:

1.0

Published:

04/26/2010

Number of Pages:

20

File Size:

1 file , 890 KB