IEC 62899-402-1 Ed. 1.0 en:2017
IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
Product Details
- Edition:
- 1.0
- Published:
- 03/03/2017
- Number of Pages:
- 12
- File Size:
- 1 file , 380 KB