IEEE 641-1987

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New IEEE Standard – Inactive-Withdrawn.This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.

Product Details

Published:

10/07/1988

ISBN(s):

9780738142357

Number of Pages:

34

File Size:

1 file , 2.6 MB

Product Code(s):

STDWD12195