JEDEC JESD28-1
Click here to purchase
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Product Details
- Published:
- 09/01/2001
- Number of Pages:
- 14
- File Size:
- 1 file , 55 KB